Nanometrics Incorporated, incorporated on January 18, 2005, is a provider of process control metrology and inspection systems used primarily in the fabrication of semiconductors and other solid-state devices, including sensors, optoelectronic devices, high-brightness (HB) light emitting diodes (LEDs), discretes and data storages components. The Company’s automated and integrated metrology systems measure critical dimensions, device structures, topography and various thin film properties, including three-dimensional features and film thickness, as well as optical, electrical and material properties. The Company’s process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to production of semiconductors and other devices, to three-dimensional wafer-level packaging applications. The Company’s automated systems primarily consist of automated metrology systems that are employed in semiconductor production environments.The Company’s Atlas III, Atlas II+, and Atlas XP/Atlas XP+ represent its line of metrology systems providing optical critical dimension (OCD), thin film metrology and wafer stress for transistor and interconnect metrology applications. The OCD technology is supported by its NanoCD suite of solutions, including its NanoDiffract software and NanoGen scalable computing engine that enables visualization, modeling and analysis of structures. The Company’s integrated metrology (IM) systems are installed directly onto wafer processing equipment to provide near real-time measurements. Its Trajectory system provides in-line measurement of layers in thin film thickness and composition in semiconductor applications.
|Bank Name||Nanometrics Incorporated|
|CEO||Dr. Pierre Yves Lesaicherre|